New equipment advances materials analysis
Monica Cooney
Feb 12, 2026
The Materials Characterization Facility (MCF) recently expanded its footprint in the F-level of Hamerschlag Hall, adding two new lab spaces and three new scanning electron microscopes (SEM) in the last year. New equipment includes the Zeiss Crossbeam 550 Ga FIB-SEM, ThermoFisher Hydra Plasma FIB-SEM, and Zeiss Sigma 560 VP SEM with in situ solution.
A focused ion beam (FIB) allows a user to remove material in a precise and controlled manner to see below the surface. In the Zeiss Crossbeam, ion and electron beams meet at the coincidence point on the sample so that users can cut into the sample with the ion beam and then image the cross-section with the electron beam. It is a valuable tool for failure analysis, localized patterning, sample manipulation, TEM sample preparation, and imaging.
In the ThermoFisher Hydra, the imaging process is similar to that of the Crossbeam, but the source of ions is different. The plasma source allows for higher current, which means faster and larger area milling. The Hydra is an extremely versatile instrument, offering four different gases - xenon, argon, oxygen, and nitrogen- for the plasma ion species and impressive speed from high currents.
The Zeiss Sigma forms images by scanning a finely focused electron beam across the sample and detecting the resulting signals at each point. The Variable Pressure (VP) allows a user to look at non‑conductive or samples with defects by letting a small amount of gas into the chamber to reduce charging. The system supports automated in‑situ experiments and unattended workflows, treating the SEM as an integrated lab where stages, detectors, and formulas can be scripted.
“Now that this equipment has been installed and staff and users are learning how to operate these tools, we are looking forward to seeing how we can effectively use these tools to impact materials discovery,” said professor Marc De Graef, who serves as MCF Faculty Director.
The new additions to our facility will further strengthen our collaborative efforts in academia, industry, and government partners
Betsy Clark, MCF Managing Director
In addition to the spaces that house these new tools, the MCF has also added a dedicated area to support its Atomic Force Microscopy (AFM) laboratory. In this space, users can use equipment to map the topography and properties of a sample at the nanometer scale.
The new equipment and lab space in Hamerschlag Hall complement the MCF’s world-class X-ray laboratory, which houses the Zeiss Xradia Crystal CT, Xenocs Xeuss 3.0 SAXS/WAXS, and Malvern Panalytical Empyrean XRD.
In January, the MCF hosted a “Grand Opening” event to highlight the new equipment and space, as well as the work of student and faculty researchers. The daylong event included instrument demonstrations, facility tours, and a poster session.
“We are proud to be able to showcase the breadth of the work that is accomplished in the MCF, across colleges and departments,” said MCF Managing Director Betsy Clark. “The new additions to our facility will further strengthen our collaborative efforts in academia, industry, and government partners.”