Progress, Challenges, and Opportunities in 3D Materials Characterization Using X-rays and Beyond, presented by Will Harris, Ph.D., ZEISS Microscopy
This seminar will provide a perspective on current technology and science using 3D and multiscale microscopy methods. It will cover significant recent advances as well as emerging possibilities, including:
- Principles and capabilities of high resolution 3D X-ray tomography, from the familiar attenuation contrast imaging to the emerging diffraction contrast tomography technique
- Recent developments in deep learning-based tomography reconstruction to drastically decrease image noise, decrease acquisition scan time, and/or increase 3D data volume size
- Opportunities for combining the strengths of multiple imaging modes (X-rays, electrons, ions, visible photons) in correlated workflows to improve sample navigation, data representativeness, and multiscale/modal contextuality
- A primary focus will be on applications in materials science and engineering, but will also touch on relevance in other research areas such as geoscience, microelectronics, and life sciences