SAXS Seminar

August 09, 2022

10:00 a.m. ET

Materials Characterization Facility

A unique opportunity to learn about the Xenocs Xeuss SAXS arriving this November in the Materials Characterization Facility.

Presented by Dr. Scott Barton, Xenocs

The Xenocs Xuess 3.0 SAXS will support the development of cutting-edge nano-structured materials that have keys features ranging in size from Angstroms to hundreds of nanometers. To enable in situ and in operando characterization of structural properties, this custom, automated Xenocs Xeuss 3.0 x-ray scattering system will enable high-throughput studies at a variety of length scales.

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