Equipment

Solver NEXT analysis modes

  • Tapping and Contact AFM
  • Lateral Force Microscopy
  • Phase Contrast Microscopy
  • Magnetic Force Microscopy
  • Electrostatic Force Microscopy
  • Kelvin Probe Microscopy
  • Scanning Capacitance Microscopy
  • Piezoresponse Microscopy
  • Scanning Tunneling Microscopy
Location
Roberts Hall
Function
Scanning Probe Microscopy
Contact
Andrew Nickischer
Rates and materials
  • Rate type: Hourly
  • CMU (Internal): $35