NTEGRA analysis modes
- Tapping and Contact AFM
- Lateral Force Microscopy
- Phase Contrast Microscopy
- Magnetic Force Microscopy
- Electrostatic Force Microscopy
- Kelvin Probe Microscopy
- Scanning Capacitance Microscopy
- Piezoresponse Microscopy
- In Liquid AFM
- High Resolution AFM
- High Voltage Electrical and Piezoresponse Microscopy
- Stiffness
- Surface Adhesion
- Deformation