NTEGRA analysis modes

  • Tapping and Contact AFM
  • Lateral Force Microscopy
  • Phase Contrast Microscopy
  • Magnetic Force Microscopy
  • Electrostatic Force Microscopy
  • Kelvin Probe Microscopy
  • Scanning Capacitance Microscopy
  • Piezoresponse Microscopy
  • In Liquid AFM
  • High Resolution AFM
  • High Voltage Electrical and Piezoresponse Microscopy
  • Stiffness
  • Surface Adhesion
  • Deformation